CANCELLED: Sergei Magonov "Atomic Force Microscopy: High-Resolution Imaging and Quantitative Mapping of Mechanical and Electric Properties at Sub-100 nm Scale"

Current developments in Atomic Force Microscopy (AFM) empower its applications with three main techniques: the DC contact mode, oscillatory resonant and non-resonant modes. A comparative analysis of the modes shows that they differ in the level, type and time frame of tip-sample force interactions. These modes are complementary in visualization of surface structures down to the atomic-scale, compositional imaging of heterogeneous materials as well as in detection and mapping of the materials’ quantitative mechanical and electric properties with 10 nm spatial resolution or better. An invaluable help for compositional mapping of multi-component materials comes from a combination of AFM with spectroscopic techniques such as Raman scattering, which provides chemically-specific information. The capabilities of high-resolution imaging and quantitative mapping of elastic modulus and work of adhesion will be demonstrated on multiple samples of alkanes, semicrystalline polymers, polymer blends and block copolymers. The AFM-based electric modes provide an access to the local properties such as surface potential, dielectric permittivity, thermoelectric Seebeck effect, and piezo-response. The measurements and nano-scale mapping of these properties will be illustrated by the practical examples taken from studies of different compounds, which include besides polymers, metal alloys, semiconductors, piezo-electric and ferroelectric materials.